MIRAE

Products

홈
Products
ATE (Semiconductor Handler)
Module Test Handler
ATE (Semiconductor Handler) MAI LMT (Linear Motor)

ATE (Semiconductor Handler)

Memory Test HandlerBurn-In SortersBurn-In Sorter OptionsApplication Test HandlerLogic Test HandlerModule Test HandlerAuto ScrapChiller

Module Test Handler

  • MR7500
    MR7500

    High Performance & Productivity

    • Tri-temp control : -10℃ ~ +125℃
    • Max 16 parallel Test(16 *para 1 step / 8 para 2steps)
    • Throughput : 2,000 UPH

    High Versatility

    • Versatile interface kit: T5365, T5581, T5591, AL6080, AL6090, HP95000 etc
    • Various Module test: 72 ~ 240 pins DIMM/RIMM
    아이템 제품사양
    도킹 방식 (Docking Type) 수직 도킹 테스트 핸들러
    (Vertical Docking Test Handler)
  • MM32
    MM32

    The R-DIMM, SO-DIMM, and CMM compatible 32Para Test Handler is a 32-parallel high-speed test handler capable of testing various memory modules (R-DIMM, SO-DIMM, CMM) on a single machine.

    • R-DIMM, SO-DIMM, and CMM (CXL) Compatible 32Para Test Handler
    • Horizontal / Direct Contact Type
    • PARA: DIMM (R/S) 32P / CMM 8P

    Key Features

    • Supports integrated testing for R-DIMM, SO-DIMM, and CMM (CXL)
    • Secures high productivity through 32-parallel simultaneous testing
    • Provides compatibility with various memory modules
    • Implements high-speed and high-precision testing
    • Improves production efficiency and reduces testing costs
    • Minimizes conversion time with a non-COOK method
    아이템 제품사양
    도킹 방식 (Docking Type) 수직 도킹 테스트 핸들러
    (Vertical Docking Test Handler)